· Early Work on Linear and Circular Magnetic Dichroism
core levels in magnetic
metals (refs. 8,10,11)
· Synchrotron Radiation/Photoemission Studies of:
bulk electronic properties/ferromagnets
(refs. 20, 32, 94)
surface states on magnetic
metals (refs. 17, 21, 31, 89)
electronic structure/epitaxial
magnetic films (refs. (40, 48, 90)
spin-polarized electron
studies (refs. 87, 96, 98)
core-level shifts (refs.
113, 116, 117)
hydrogen/Nb surface interactions
(refs. 76, 79)
finite temperature magnetism/exchange
(refs. 87, 94)
surface magnetism Gd (ref.
99)
layer-dependent electronic
structure (refs. 86, 96, 115)
· Inelastic Electron Scattering/Surface Lattice Dynamics:
structure analysis based
on surface vibrations (refs. 36, 38, 39)
metal surface/H interactions
(refs. 41, 58, 66)
vibrational resonances/scattering
(refs. 45, 57)
detection of shear surface
modes (ref. 78)
reviews inelastic scattering/lattice
dynamics (refs. 59, 128)
scattering mechanisms (refs.
27, 45, 57)
· Surface Chemistry/Adsorption:
orientation of methoxy on Ni(111) (ref. 15)
photoemission/Xenon (refs. 18, 51, 61)
nitrogen states on W(100) (ref. 72)
· Fast Laser Pulse Photoemission (refs. 79, 80, 88, 101, 104,
105)
· Thin Magnetic Films/Magneto-optic Kerr Effect
spin-polarized photoemission dilemma (ref. 4)
critical exponents/anisotropy (refs. 68, 74, 77, 93)
dead layers/search for surface magnetism (refs. 82, 92)
surface step induced anisotropy (refs. 97, 100)
review (ref. 110)
hysteresis dynamics (refs. 119, 121, 123)
enhanced moments/ultrathin films (ref. 109)
· Surface Structure Analysis
order-disorder transition W(100) c(2x2) (ref. 114)
photoelectron diffraction W(110) (ref. 103)
LEED crystallography Rh(001) and H/Rh(001) (ref. 122)
LEED crystallography W(110)/surface roughness (ref. 124)
· Instrumentation Papers
angle-resolving analyzer/photoemission (refs. 19, 30)
multichannel detection/electron optics (refs. 37, 70)
synchrotron monochromators (refs. 43, 61, 73, 106)
Kerr effect instrument (ref. 74)
spin detection/Mott polarimeter (ref. 108)
tiime-of-flight photoemission/channel plate response (ref. 88)
high-speed Kerr polarimeter/microscope (ref. 127)
high-resolution LEED (ref. 102)
electron energy analyzers (refs. 47, 111)