Nano Electronic Materials Research Group

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Cross-sectional STM/S

XSTM, cross-sectional scanning tunneling microscopy, is a promising tool for studying the material structure and electronic property grown by MBE, MOCVD etc.

Our research in XSTM is to explore the structures and electronic properties of Quantum Dots and Interfaces using XSTM.

• Introduction to XSTM
  
• Research projects

XSTM Study of InGaAs Quantum Dots
2D Pair Correlation study
XSTM study of InGaAs:N/GaAs Heterostructures
XSTM study of InGaAs/GaAs Heterostructures
XSTM study of GaMnAs
Scanning Thermoelectric Microscopy

• Publications and Presentations

 

 

 

Nano Electronic Material Research Group

The University of Texas at Austin